AFM Probes » SSS-NCL

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Order Code / Price*
Quantity
SSS-NCL-10 Box of 10 AFM Probes
757.00 USD
SSS-NCL-50 Box of 50 AFM Probes
2 988.00 USD
Your volume discount is 797.00 USD or 21.10%
Product availability: On stock

SSS-NCL

SuperSharp, Tapping Mode AFM Probe with Long Cantilever

Coating: none
Tip shape: Supersharp
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

Applications

NANOSENSORS™ SSS-NCL probes are designed for non-contact mode or tapping mode AFM. It is offered as an alternative to the NANOSENSORS™ high frequency non contact type (NCH). The SSS-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

  • excellent tip radius of curvature
  • typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • monolithic material
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 48 N/m (21 - 98 N/m)*
  • 190 kHz (146 - 196 kHz)*
  • 225 µm (215 - 235 µm)*
  • 38 µm (30 - 45 µm)*
  • 7 µm (6 - 8 µm)*
  • * typical range
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