AFM Probes » SSS-SEIHR

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Quantity
SSS-SEIHR-10 Box of 10 AFM Probes
757.00 USD
SSS-SEIHR-20 Box of 20 AFM Probes
1 355.00 USD
Your volume discount is 159.00 USD or 10.50%
SSS-SEIHR-50 Box of 50 AFM Probes
2 988.00 USD
Your volume discount is 797.00 USD or 21.10%
Product availability: On stock

SSS-SEIHR

SuperSharp, Special Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflex Aluminum
AFM tip shape: Supersharp
AFM Cantilever
F 130 kHz
C 15 N/m
L 225 µm
*nominal values

Applications

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For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • typical aspect ratio at 200 nm from AFM tip apex in the order of 4:1
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the AFM cantilever less than 2% of the AFM cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 15 N/m (5 - 37 N/m)*
  • 130 kHz (96 - 175 kHz)*
  • 225 µm (215 - 235 µm)*
  • 33 µm (30 - 45 µm)*
  • 5 µm ( 4 - 6 µm)*
  • * typical range
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