AFM Probes » TESPA

 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
TESPA-10 Box of 10 AFM Probes
307.00 USD
TESPA-50 Box of 50 AFM Probes
1 215.00 USD
Your volume discount is 320.00 USD or 20.80%
TESPA-W Box of 380 AFM Probes
6 239.00 USD
Your volume discount is 5 427.00 USD or 46.50%
Product availability: On stock

TESPA

Standard Tapping Mode AFM Probe

Coating: Reflex Aluminum
Tip shape: Standard
Cantilever:
F 320 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
 
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

This product features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • 4 µm (3.5 - 4.5 µm)*
  • * typical range
    Loading
    nanosensors-logo nanoworld-logo budgetsensors-logo mikromasch-logo opus-logo nanotools-logo