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TESPA-HAR

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Order Code / Price*
Quantity
TESPA-HAR-10 Box of 10 AFM Probes
915.00 USD
TESPA-HAR-20 Box of 20 AFM Probes
1637.00 USD
Your volume discount is 193.00 USD or 10.50%
TESPA-HAR-50 Box of 50 AFM Probes
3612.00 USD
Your volume discount is 963.00 USD or 21.00%
TESPA-HAR-380 Box of 380 AFM Probes
18978.00 USD
Your volume discount is 15792.00 USD or 45.40%
Product availability: On stock

TESPA-HAR

High-Aspect-Ratio, Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: Reflective Aluminum
AFM tip shape: High-Aspect-Ratio
AFM Cantilever
F 320 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

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NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored AFM tips showing a high aspect ratio portion with near-vertical sidewalls.

These AFM probes offer unique features:

  • length of the high aspect ratio portion of the tip > 2 µm
  • typical aspect ratio of this portion in the order of 7:1 (when viewed from side as well as along cantilever axis)
  • half cone angle of the high aspect ratio portion typically < 5°
  • excellent tip radius of curvature
This AFM probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acuired Veeco metrology business, is no longer selling the original AFM probe which has always been manufactured by NanoWorld®.

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range
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