AFM Probes » TESPA-HAR

 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
TESPA-HAR-10 Box of 10 AFM Probes
839.00 USD
Volume Discount Available [?]
TESPA-HAR-20 Box of 20 AFM Probes
1 502.00 USD
Your volume discount is 176.00 USD or 10.50%
TESPA-HAR-50 Box of 50 AFM Probes
3 314.00 USD
Your volume discount is 881.00 USD or 21.00%
TESPA-HAR-380 Box of 380 AFM Probes
16 795.00 USD
Your volume discount is 15 087.00 USD or 47.30%
Product availability: On stock

TESPA-HAR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflex Aluminum
Tip shape: High-Aspect-Ratio
Cantilever:
F 320 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.

These probes offer unique features:

  • length of the high aspect ratio portion of the tip > 2 µm
  • typical aspect ratio of this portion in the order of 7:1 (when viewed from side as well as along cantilever axis)
  • half cone angle of the high aspect ratio portion typically < 5°
  • excellent tip radius of curvature
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acuired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

This product features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm (3.5 - 4.5 µm)*
  • * typical range
    Loading
    nanosensors-logo nanoworld-logo budgetsensors-logo mikromasch-logo opus-logo nanotools-logo