Rectangular Cross Section AFM Cantilevers

48 results matching your criteria
160AC-NA

160AC-NA

Standard Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex Aluminum
Tip Shape: OPUS
Cantilever:
F 300 kHz
C 26 N/m
L 160 µm
OTESPA

OTESPA

Standard Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex Aluminum
Tip Shape: OPUS
Cantilever:
F 300 kHz
C 26 N/m
L 160 µm
200AC-NA

200AC-NA

Soft Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex Aluminum
Tip Shape: OPUS
Cantilever:
F 135 kHz
C 9 N/m
L 200 µm
240AC-NA

240AC-NA

Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex Aluminum
Tip Shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
OLTESPA

OLTESPA

Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex Aluminum
Tip Shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
New
160AC-SG

160AC-SG

High Resolution, Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex (Au)
Tip Shape: Supersharp,OPUS
Cantilever:
F 300 kHz
C 26 N/m
L 160 µm
New
240AC-SG

240AC-SG

High Resolution, Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex (Au)
Tip Shape: Supersharp,OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
240AC-PP

240AC-PP

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Electrically Conductive
Tip Shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
OSCM-PT

OSCM-PT

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Electrically Conductive
Tip Shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
160AC-NG

160AC-NG

Gold Coated Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex (Au)
Tip Shape: OPUS
Cantilever:
F 300 kHz
C 26 N/m
L 160 µm
Best Seller
PNP-TR

PNP-TR

Silicon Nitride AFM Probe
Coating: Reflex (Au)
Tip Shape: Pyramid
Cantilevers: 4
F 67 kHz
C 0.32 N/m
L 100 µm
F 17 kHz
C 0.08 N/m
L 200 µm
PNP-DB

PNP-DB

Silicon Nitride AFM Probe
Coating: Reflex (Au)
Tip Shape: Pyramid
Cantilevers: 4
F 67 kHz
C 0.48 N/m
L 100 µm
F 17 kHz
C 0.06 N/m
L 200 µm
New
XNC12/Cr-Au BS

XNC12/Cr-Au BS

AFM Probe with 2 Different Gold Coated Silicon Nitride Cantilevers on Each Side of the Chip
Coating: Reflex (Au)
Tip Shape: Pyramid
Cantilevers: 4
F 17 kHz
C 0.08 N/m
L 200 µm
F 67 kHz
C 0.32 N/m
L 100 µm
New
55AC-NN

55AC-NN

Ultra High Frequency AFM Probe with Tip at the Very End of the Cantilever
Coating: none
Tip Shape: OPUS
Cantilever:
F 1200 kHz
C 100 N/m
L 65 µm
New
55AC-NA

55AC-NA

Ultra High Frequency AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex Aluminum
Tip Shape: OPUS
Cantilever:
F 1200 kHz
C 100 N/m
L 65 µm
New
55AC-NG

55AC-NG

Gold Coated Ultra High Frequency AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex (Au)
Tip Shape: OPUS
Cantilever:
F 1200 kHz
C 100 N/m
L 65 µm
PNP-TRS

PNP-TRS

Silicon Nitride AFM Probe Single Cantilever Compatible with ScanAsyst® Mode

Coating: Reflex (Au)
Tip Shape: Pyramid
Cantilever:
F 67 kHz
C 0.32 N/m
L 100 µm
240AC-NG

240AC-NG

Gold Coated Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex (Au)
Tip Shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
240AC-MA

240AC-MA

Hard Magnetic, Medium Momentum AFM Probe with Tip at the Very End of the Cantilever
Coating: Magnetic
Tip Shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
New
3XC-NA

3XC-NA

AFM Probe with 3 Different Cantilevers for Various Applications and  Tips at the Very End of the Cantilevers
Coating: Reflex Aluminum
Tip Shape: OPUS
Cantilevers: 3
F 17 kHz
C 0.3 N/m
L 500 µm
F 150 kHz
C 9 N/m
L 175 µm
F 75 kHz
C 2.5 N/m
L 240 µm
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