AFM Probes » HiRes-C15/Cr-Au

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HiRes-C15/Cr-Au-5 Box of 5 AFM Probes
400.00 USD
Product availability: On stock
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HiRes-C15/Cr-Au

High Resolution, Tapping Mode AFM Probe

Coating: Reflex (Au)
Tip shape: Supersharp
Cantilever:
F 325 kHz
C 40 N/m
L 125 µm
*nominal values

Applications

Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when the high topographic and phase contrast are necessary. The 15 series is also good for non-contact mode.

High-resolution probe with a hydrophobic diamond-like extratip at the apex of the silicon etched probe.

This product features alignment grooves on the back side of the holder chip.

Cr-Au coating on both sides of the cantilever. The coating does not cover the extratip!

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 40 N/m (20 - 80 N/m)*
  • 325 kHz (265 - 410 kHz)*
  • 125 µm
  • 30 µm
  • 4 µm
  • * typical range
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