AFM Probes » HiRes-C18/Cr-Au

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HiRes-C18/Cr-Au-5 Box of 5 AFM Probes
495.00 USD
Product availability: On stock
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HiRes-C18/Cr-Au

High Resolution, Soft Tapping Mode AFM Probe

Manufacturer: MikroMasch

Coating: Reflex Gold
AFM tip shape: Supersharp
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

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AFM cantilevers of the 18 series are optimal for Lift mode operation AFM since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM cantilevers are also used for mapping of materials properties in Force modulation mode and true topography imaging of the soft samples in Soft tapping mode.

High-resolution AFM probe with a hydrophobic diamond-like extratip at the apex of the silicon etched AFM probe.

This product features alignment grooves on the back side of the holder chip.

Cr-Au coating on both sides of the cantilever. The coating does not cover the extratip!

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (220 - 230 µm)*
  • 27.5 µm (24.5 - 30.5 µm)*
  • 3 µm ( 2.5 - 3.5 µm)*
  • * typical range
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