AFM Probes » HQ:CSC17/Al BS

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Order Code / Price*
Quantity
HQ:CSC17/Al BS-15 Box of 15 AFM Probes
300.00 USD
Volume Discount Available [?]
HQ:CSC17/Al BS-50 Box of 50 AFM Probes
850.00 USD
Your volume discount is 150.00 USD or 15.00%
HQ:CSC17/Al BS-100 Box of 100 AFM Probes
1 530.00 USD
Your volume discount is 470.00 USD or 23.50%
HQ:CSC17/Al BS-200 Box of 200 AFM Probes
2 720.00 USD
Your volume discount is 1 280.00 USD or 32.00%
HQ:CSC17/Al BS-400 Box of 400 AFM Probes
4 080.00 USD
Your volume discount is 3 920.00 USD or 49.00%
Product availability: On stock
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HQ:CSC17/Al BS

Standard Contact Mode AFM Probe

Coating: none
Tip shape: Rotated
Cantilever:
F 13 kHz
C 0.18 N/m
L 450 µm
*nominal values

Applications

Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.

This product features alignment grooves on the back side of the holder chip.

Backside Al coated. Coating thickness - 30 nm.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.18 N/m (0.06 - 0.4 N/m)*
  • 13 kHz (10 - 17 kHz)*
  • 2 µm
  • * typical range
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