Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.
This product features alignment grooves on the back side of the holder chip.
Backside Al coated. Coating thickness - 30 nm.
(0.06 - 0.4 N/m)*
(10 - 17 kHz)*
(445 - 455 µm)*
(47 - 53 µm)*
( 1.5 - 2.5 µm)*
* typical range
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