AFM Probes » HQ:CSC17/Cr-Au BS

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Order Code / Price*
Quantity
HQ:CSC17/Cr-Au BS-15 Box of 15 AFM Probes
390.00 USD
Volume Discount Available [?]
HQ:CSC17/Cr-Au BS-50 Box of 50 AFM Probes
1 000.00 USD
Your volume discount is 300.00 USD or 23.10%
Product availability: On stock
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HQ:CSC17/Cr-Au BS

Gold Coated Contact Mode AFM Probe

Manufacturer: MikroMasch

Coating: Reflex Gold
AFM tip shape: Rotated
AFM cantilever:
F 13 kHz
C 0.18 N/m
L 450 µm
*nominal values

Applications

Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.

This product features alignment grooves on the back side of the holder chip.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on the backside of the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.18 N/m (0.06 - 0.4 N/m)*
  • 13 kHz (10 - 17 kHz)*
  • 450 µm (445 - 455 µm)*
  • 50 µm (47 - 53 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • * typical range
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