AFM cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tapping AFM tip. AFM probes with coatings can also be used in conductive AFM techniques.
This AFM probe features alignment grooves on the back side of the holder chip.
Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on the back side of the AFM cantilever.
(1.8 - 13 N/m)*
(110 - 220 kHz)*
(120 - 130 µm)*
(22 - 28 µm)*
( 1.6 - 2.6 µm)*
* typical range
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