AFM cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when high topographic and phase contrast are necessary. The 15 series is also suitable for non-contact mode.
A wear-resistant coating with thickness 20 nm is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.
This AFM probe features alignment grooves on the back side of the holder chip.