AFM Probes » HQ:NSC15/Hard/Al BS

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HQ:NSC15/Hard/Al BS-15 Box of 15 AFM Probes
390.00 USD
HQ:NSC15/Hard/Al BS-50 Box of 50 AFM Probes
1000.00 USD
Your volume discount is 300.00 USD or 23.10%
Product availability: On stock
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HQ:NSC15/Hard/Al BS

top value

Long Scanning, DLC Hardened Tapping Mode AFM Probe

Manufacturer: MikroMasch

Coating: Hard Diamond-Like-Carbon
AFM tip shape: Rotated
AFM Cantilever
F 325 kHz
C 40 N/m
L 125 µm
*nominal values

Applications

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AFM cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when the high topographic and phase contrast are necessary. The 15 series is also suitable for non-contact mode.

A wear-resistant coating with thickness 20 nm is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

This product features alignment grooves on the back side of the holder chip.

Wear-resistant coating with thickness 20 nm on the tip side of the AFM cantilever. Al coating with thickness 30nm on the back side of the AFM cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 40 N/m (20 - 80 N/m)*
  • 325 kHz (265 - 410 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (27 - 33 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range
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