AFM Probes »

HQ:NSC16/Cr-Au BS

Order Code / Price*

Quantity

HQ:NSC16/Cr-Au BS-15 Box of 15 AFM Probes

420 420.00 USD

Volume Discount Available [?]

HQ:NSC16/Cr-Au BS-50 Box of 50 AFM Probes

1200 1200.00 USD

Your volume discount is 200.00 USD or 14.30%

Product availability: On stock

AFM tip of MikroMasch long-cantilever tapping mode AFM probe

AFM cantilever of MikroMasch long-cantilever tapping mode AFM probe

SEM image of MikroMasch general purpose AFM probe tip close-up

Schematic of single lever MikroMasch® AFM Probe

HQ:NSC16/Cr-Au BS

Gold Coated Tapping Mode AFM Probe with Long AFM Cantilever

Manufacturer: MikroMasch

Coating: Reflective Gold
AFM tip shape: Rotated

AFM Cantilever

F 190 kHz

C 45 N/m

L 225 µm

*nominal values

Applications

How to optimize AFM scan parameters

How to use standard AFM Probes on Park AFM Systems

AFM cantilevers of the 16 series with high spring constant and low resonance frequency (below 250 kHz) can be used in tapping mode in SPM that has a low-frequency feedback loop.

These AFM cantilevers also fit SPM systems that do not support AFM probes with short lever arms.

The monolithic silicon HQ AFM probes offer high consistency of the AFM tip radius, cantilever reflectivity and quality factor.

This AFM probe features alignment grooves on the back side of the holder chip.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on the back side of the AFM cantilever.

AFM Tip:

Shape: Rotated

Height: 15 µm (12 - 18 µm)*

Full Cone Angle: 40°

Radius: < 8 nm

AFM Cantilever:

Shape: Beam

Force Constant: 45 N/m (30 - 70 N/m)*

Resonance Frequency: 190 kHz (170 - 210 kHz)*

Length: 225 µm (220 - 230 µm)*

Width: 37.5 µm (34.5 - 40.5 µm)*

Thickness: 7 µm ( 6.5 - 7.5 µm)*

* typical range