AFM Probes » HQ:NSC18/Cr-Au BS

Order Code / Price*

Quantity

HQ:NSC18/Cr-Au BS-15 Box of 15 AFM Probes

390 390.00 USD

Volume Discount Available [?]

HQ:NSC18/Cr-Au BS-50 Box of 50 AFM Probes

1000 1 000.00 USD

Your volume discount is 300.00 USD or 23.10%

Product availability: On stock

SEM image of single cantilever AFM probe

SEM image of the cantilever

SEM image of general purpose AFM probe tip close-up

HQ probe tip close-up

Schematic of single lever MikroMasch AFM probe

Schematic drawing of the cantilever

HQ:NSC18/Cr-Au BS

top value

Gold Coated Force Modulation AFM Probe

Coating: Reflex Gold
Tip shape: Rotated

Cantilever:

F 75 kHz

C 2.8 N/m

L 225 µm

*nominal values

Applications

Cantilevers of the 18 series are optimal for the Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in Force modulation mode and the true topography imaging of the soft samples.

This product features alignment grooves on the back side of the holder chip.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on the backside of the cantilever.

AFM Tip:

Shape: Rotated

Height: 15 µm (12 - 18 µm)*

Full Cone Angle: 40°

Radius: < 8 nm

AFM Cantilever:

Shape: Beam

Force Constant: 2.8 N/m (1.2 - 5.5 N/m)*

Resonance Frequency: 75 kHz (60 - 90 kHz)*

Length: 225 µm (220 - 230 µm)*

Width: 27.5 µm (24.5 - 30.5 µm)*

Thickness: 3 µm (2.5 - 3.5 µm)*

* typical range

AFM Probes » HQ:NSC18/Cr-Au BS

HQ:NSC18/Cr-Au BS