AFM Probes » HQ:NSC18/Cr-Au BS

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HQ:NSC18/Cr-Au BS-15 Box of 15 AFM Probes
390.00 USD
HQ:NSC18/Cr-Au BS-50 Box of 50 AFM Probes
1000.00 USD
Your volume discount is 300.00 USD or 23.10%
Product availability: On stock
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HQ:NSC18/Cr-Au BS

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Gold Coated Force Modulation AFM Probe

Manufacturer: MikroMasch

Coating: Reflex Gold
AFM tip shape: Rotated
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

How to optimize AFM scan parameters gear icon

AFM cantilevers of the 18 series are optimal for Lift mode operation AFM since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM cantilevers are also used for mapping of materials properties in Force modulation mode and true topography imaging of the soft samples in Soft tapping mode.

This product features alignment grooves on the back side of the holder chip.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on the back side of the AFM cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (220 - 230 µm)*
  • 27.5 µm (24.5 - 30.5 µm)*
  • 3 µm ( 2.5 - 3.5 µm)*
  • * typical range
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