AFM Probes » HQ:NSC35/Hard/Al BS

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HQ:NSC35/Hard/Al BS-15 Box of 15 AFM Probes
390.00 USD
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HQ:NSC35/Hard/Al BS-50 Box of 50 AFM Probes
1 000.00 USD
Your volume discount is 300.00 USD or 23.10%
Product availability: On stock
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HQ:NSC35/Hard/Al BS

AFM Probe with 3 Different Long Scanning, DLC Hardened Tapping Mode Cantilevers

Coating: Hard Diamond-Like-Carbon
Tip shape: Rotated
This probe features 3 cantilevers
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
*nominal values

Applications

Probes of the 35 series have three different tapping mode cantilevers on one side of the holder chip. They can be used in various applications.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

This product features alignment grooves on the back side of the holder chip.

Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.

AFM Tip:


  • 3 AFM Cantilevers:

    Cantilever A
  • Beam
  • 8.9 N/m (2.7 - 24 N/m)*
  • 205 kHz (130 - 290 kHz)*
  • 110 µm
  • 35 µm
  • 2 µm
  • Cantilever B
  • Beam
  • 16 N/m (4.8 - 44 N/m)*
  • 300 kHz (185 - 430 kHz)*
  • 90 µm
  • 35 µm
  • 2.0 µm
  • Cantilever C
  • Beam
  • 5.4 N/m (1.7 - 14 N/m)*
  • 150 kHz (95 - 205 kHz)*
  • 130 µm
  • 35 µm
  • 2.0 µm
  • * typical range
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