AFM Probes » HQ:NSC35/Hard/Al BS

Order Code / Price*

Quantity

HQ:NSC35/Hard/Al BS-15 Box of 15 AFM Probes

390 390.00 USD

Volume Discount Available [?]

HQ:NSC35/Hard/Al BS-50 Box of 50 AFM Probes

1000 1 000.00 USD

Your volume discount is 300.00 USD or 23.10%

Product availability: On stock

SEM image of 3 AFM cantilevers on NSC series chip

SEM image of 3 cantilevers on
chip (NSC35/36 series)

SEM image of long scanning HARD series AFM probe tip close-up

DLC coated probe tip close-up

Schematic of 3 AFM cantilevers on NSC series chip

Schematic drawing of 3 cantilevers on chip

HQ:NSC35/Hard/Al BS

AFM Probe with 3 Different Long Scanning, DLC Hardened Tapping Mode Cantilevers

Manufacturer: MikroMasch

Coating: Hard Diamond-Like-Carbon
Tip shape: Rotated

This probe features 3 cantilevers

F 205 kHz

C 8.9 N/m

L 110 µm

F 300 kHz

C 16 N/m

L 90 µm

F 150 kHz

C 5.4 N/m

L 130 µm

*nominal values

Applications

Probes of the 35 series have three different tapping mode cantilevers on one side of the holder chip. They can be used in various applications.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.

AFM Tip:

Shape: Rotated

Height: 15 µm (12 - 18 µm)*

Full Cone Angle: 40°

Radius: < 20 nm

3 AFM Cantilevers:

Cantilever A

Shape: Beam

Force Constant: 8.9 N/m (2.7 - 24 N/m)*

Resonance Frequency: 205 kHz (130 - 290 kHz)*

Length: 110 µm (105 - 115 µm)*

Width: 35 µm (32 - 38 µm)*

Thickness: 2 µm ( 1.5 - 2.5 µm)*

Cantilever B

Shape: Beam

Force Constant: 16 N/m (4.8 - 44 N/m)*

Resonance Frequency: 300 kHz (185 - 430 kHz)*

Length: 90 µm (85 - 95 µm)*

Width: 35 µm (32 - 38 µm)*

Thickness: 2 µm ( 1.5 - 2.5 µm)*

Cantilever C

Shape: Beam

Force Constant: 5.4 N/m (1.7 - 14 N/m)*

Resonance Frequency: 150 kHz (95 - 205 kHz)*

Length: 130 µm (125 - 135 µm)*

Width: 35 µm (32 - 38 µm)*

Thickness: 2 µm ( 1.5 - 2.5 µm)*

* typical range

AFM Probes » HQ:NSC35/Hard/Al BS

HQ:NSC35/Hard/Al BS

AFM Probe with 3 Different Long Scanning, DLC Hardened Tapping Mode Cantilevers