AFM Probes » HQ:NSC36/Co-Cr/Al BS

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HQ:NSC36/Co-Cr/Al BS-15 Box of 15 AFM Probes
390.00 USD
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HQ:NSC36/Co-Cr/Al BS-50 Box of 50 AFM Probes
1 000.00 USD
Your volume discount is 300.00 USD or 23.10%
Product availability: On stock
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HQ:NSC36/Co-Cr/Al BS

Hard Magnetic, Medium Momentum AFM Probe with 3 Different Cantilevers

Coating: Magnetic
Tip shape: Rotated
This probe features 3 cantilevers
F 60 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
*nominal values

Applications

Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip.

The coating consists of a Co layer on the tipside of the cantilever. The Co layer is formed as a polycrystalline film, which allows steady permanent magnetization in the direction of the tip axis. All chips are pre-magnetized at the facility before shipping to end users. In some cases additional magnetization by an arbitrary strong magnet is required, e.g. SmCo or NdFeB.

The Co coating is protected from oxidation by a thin Cr layer, resulting in longer cantilever performance.

This product features alignment grooves on the back side of the holder chip.

Co and Cr layer on the tipside of the cantilever. Aluminum coating with thickness 30 nm on the backside of the cantilever.

AFM Tip:


  • 3 AFM Cantilevers:

    Cantilever A
  • Beam
  • 1 N/m (0.1 - 4.6 N/m)*
  • 60 kHz (30 - 160 kHz)*
  • 110 µm
  • 32.5 µm
  • 1 µm
  • Cantilever B
  • Beam
  • 2 N/m (0.2 - 9 N/m)*
  • 130 kHz (45 - 240 kHz)*
  • 90 µm
  • 32.5 µm
  • 1 µm
  • Cantilever C
  • Beam
  • 0.6 N/m (0.06 - 2.7 N/m)*
  • 65 kHz (25 - 115 kHz)*
  • 130 µm
  • 32.5 µm
  • 1 µm
  • * typical range
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