AFM Probes » HQ:NSC36/Cr-Au

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HQ:NSC36/Cr-Au-15 Box of 15 AFM Probes
360.00 USD
HQ:NSC36/Cr-Au-50 Box of 50 AFM Probes
900.00 USD
Your volume discount is 300.00 USD or 25.00%
HQ:NSC36/Cr-Au-100 Box of 100 AFM Probes
1 620.00 USD
Your volume discount is 780.00 USD or 32.50%
Product availability: On stock
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HQ:NSC36/Cr-Au

AFM Probe with 3 Different Gold Coated Force Modulation Mode AFM Cantilevers

Manufacturer: MikroMasch

Coating: Gold Overall
AFM tip shape: Rotated
This probe features 3 cantilevers
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
*nominal values

Applications

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AFM probes of the 36 series have three different Force modulation mode AFM cantilevers on one side of the holder chip. They can be used in various applications.

AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tip side and back side of the AFM cantilever.

AFM Tip:


  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 1 N/m (0.1 - 4.6 N/m)*
  • 90 kHz (30 - 160 kHz)*
  • 110 µm (105 - 115 µm)*
  • 32.5 µm (29.5 - 35.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • Cantilever B
  • Beam
  • 2 N/m (0.2 - 9 N/m)*
  • 130 kHz (45 - 240 kHz)*
  • 90 µm (85 - 95 µm)*
  • 32.5 µm (29.5 - 35.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • Cantilever C
  • Beam
  • 0.6 N/m (0.06 - 2.7 N/m)*
  • 65 kHz (25 - 115 kHz)*
  • 130 µm (125 - 135 µm)*
  • 32.5 µm (29.5 - 35.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • * typical range
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