Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip. They can be used in various applications.
Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°.