AFM Probes » qp-CONT

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Order Code / Price*
qp-CONT-10 Box of 10 AFM Probes
395.00 USD
qp-CONT-50 Box of 50 AFM Probes
1 545.00 USD
Your volume discount is 430.00 USD or 21.80%
Product availability: On stock


uniqprobe™ - uniform quality SPM probe for contact mode

Manufacturer: NANOSENSORS

Coating: Reflex Gold
AFM tip shape: Circular symmetric
AFM Cantilever
F 30 kHz
C 0.1 N/m
L 125 µm
*nominal values


The NANOSENSORS uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.

The unsurpassed uniformity of the mechanical characteristics of the uniqprobe series is particularly important for applications, where a large number of probes with known and near identical force constants or resonance frequencies are needed. The sensors of the uniqprobe series are especially adapted for molecular biology, biophysics and quantitative nano-mechanical studies.

NANOSENORS qp-CONT AFM probes are designed for contact mode AFM imaging in air or liquid environments. The CONT type is optimized for high sensitivity due to a low force constant.

The probe offers unique features:

  • small dispersion of force constant and resonance frequency 
  • typical tip height 7µm 
  • typical tip radius of curvature smaller than 10nm
  • stress free cantilevers with considerably less bending
  • tip and cantilevers are made of a quartz-like material
  • reduced drift for applications in liquid environments
  • tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
  • chemically inert

This product features alignment grooves on the back side of the holder chip.

A chromium/gold layer of about 60nm is partially coating the cantilever on the detector side near its free end where the tip is situated. The main advantages of this partial metallic coating are considerably less cantilever bending and reduced drift for SPM measurements in liquid environments.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 0.1 N/m (0.08 - 0.15 N/m)*
  • 30 kHz (26 - 34 kHz)*
  • 125 µm (120 - 130 µm)*
  • 35 µm (33 - 37 µm)*
  • 750 nm ( 720 - 780 nm)*
  • * typical range
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