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Order Code / Price*
qp-CONT-10 Box of 10 AFM Probes
415.00 USD
qp-CONT-50 Box of 50 AFM Probes
1622.00 USD
Your volume discount is 453.00 USD or 21.80%
Product availability: On stock


uniqprobe™ - uniform quality SPM probe for contact mode

Manufacturer: NANOSENSORS

Coating: Reflective Gold
AFM tip shape: Circular symmetric
AFM Cantilever
F 30 kHz
C 0.1 N/m
L 125 µm
*nominal values
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The NANOSENSORS™ uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.

The unsurpassed uniformity of the mechanical characteristics of the uniqprobe series is particularly important for applications, where a large number of AFM probes with known and near identical force constants or resonance frequencies are needed. The sensors of the uniqprobe series are especially adapted for molecular biology, biophysics and quantitative nano-mechanical studies.

NANOSENORS™ qp-CONT AFM probes are designed for contact mode AFM imaging in air or liquid environments. The CONT type is optimized for high sensitivity due to a low force constant.

The AFM probe offers unique features:

  • small dispersion of force constant and resonance frequency 
  • typical AFM tip height 7µm 
  • typical AFM tip radius of curvature smaller than 10nm
  • stress free AFM cantilevers with considerably less bending
  • AFM tip and AFM cantilevers are made of a quartz-like material
  • reduced drift for applications in liquid environments
  • AFM tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
  • chemically inert

This AFM probe features alignment grooves on the back side of the holder chip.

A chromium/gold layer of about 60nm is partially coating the AFM cantilever on the detector side near its free end where the AFM tip is situated. The main advantages of this partial metallic coating are considerably less AFM cantilever bending and reduced drift for SPM measurements in liquid environments.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 0.1 N/m (0.08 - 0.15 N/m)*
  • 30 kHz (26 - 34 kHz)*
  • 125 µm (120 - 130 µm)*
  • 35 µm (33 - 37 µm)*
  • 750 nm ( 720 - 780 nm)*
  • * guaranteed range