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Order Code / Price*
OSCM-PT-10 Box of 10 AFM Probes
320.00 USD
OSCM-PT-50 Box of 50 AFM Probes
1300.00 USD
Your volume discount is 300.00 USD or 18.80%
OSCM-PT-100 Box of 100 AFM Probes
2200.00 USD
Your volume discount is 1000.00 USD or 31.30%
Product availability: On stock
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Electrical, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Electrically Conductive
AFM tip shape: OPUS
AFM Cantilever
F 70 kHz
C 2 N/m
L 240 µm
*nominal values


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The OSCM-PT is designed for AC mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc. The overall platinum coating ensures high electrical conductivity and significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

This product features alignment grooves on the back side of the holder chip.

25 nm Pt on both sides of the cantilever

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm ( 2.1 - 3.1 µm)*
  • * typical range