AFM Probes » OSCM-PT

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Order Code / Price*
Quantity
OSCM-PT-10 Box of 10 AFM Probes
290.00 USD
OSCM-PT-50 Box of 50 AFM Probes
1190.00 USD
Your volume discount is 260.00 USD or 17.90%
OSCM-PT-100 Box of 100 AFM Probes
1990.00 USD
Your volume discount is 910.00 USD or 31.40%
Product availability: On stock
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OSCM-PT

Electrical, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Electrically Conductive
AFM tip shape: OPUS
AFM Cantilever
F 70 kHz
C 2 N/m
L 240 µm
*nominal values

Applications

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The OSCM-PT is designed for AC mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc. The overall platinum coating ensures high electrical conductivity and significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

This product features alignment grooves on the back side of the holder chip.

25 nm Pt on both sides of the cantilever

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm ( 2.1 - 3.1 µm)*
  • * typical range
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