PeakForce Quantitative Nanomechanics AFM Probes
PeakForce Tapping® based quantitative nanomechanical measurements (QNM) of modulus, adhesion force, deformation, energy dissipation, etc.
In addition to the AFM probes listed below, you can also consider the NANOSENSORS™ Special Developments List AFM probes SD-R30-NCH (R=30nm) and SD-T7L100 (C=600N/m).
47 results matching your criteria
best bang for your buck


SiNi
Silicon Nitride AFM Probe with 2 Different AFM Cantilevers on Each Side of the Chip
Coating:
Reflective Gold
Tip Shape: Pyramid
Tip Shape: Pyramid
AFM Cantilevers: 4
1
2
F
30 kHz
10 kHz
C
0.27 N/m
0.06 N/m
L
100 µm
200 µm


CDT-NCHR
Diamond Coated, Conductive Tapping Mode AFM Probe
Coating:
Diamond,Conductive Diamond
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
400 kHz
C
80 N/m
L
125 µm


NW-CDT-NCHR
Diamond Coated, Conductive Tapping Mode AFM Probe
Coating:
Diamond,Conductive Diamond
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
400 kHz
C
80 N/m
L
125 µm
top value


HQ:DMD-XSC11
AFM Probe with 4 Different Diamond Coated, Conductive Cantilevers for Various Applications
Coating:
Conductive Diamond
Tip Shape: Rotated
Tip Shape: Rotated
AFM Cantilevers: 4
1
2
3
4
F
18 kHz
110 kHz
210 kHz
450 kHz
C
0.5 N/m
6.5 N/m
18 N/m
95 N/m
L
500 µm
210 µm
150 µm
100 µm


SEIHR
Special Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm


NW-SSS-SEIH
SuperSharp, Special Tapping Mode AFM Probe
Coating:
none
Tip Shape: Supersharp
Tip Shape: Supersharp
AFM Cantilever:
F
130 kHz
C
15 N/m
L
225 µm


NANOSENSORS™ Special Developments List (SDL)
Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise
Coating:
various
Tip Shape: various
Tip Shape: various