German National Metrology Institute (PTB) Scientists Present Nanomechanical Head with Exchangeable AFM Probes As IndenterWed Oct 20 2021
Discover how nanotools biosphere™ with precisely controlled 2 µm radius is applied to measure the mechanical properties of ultra-soft PDMS samples.
- Title: A MEMS nanoindenter with an integrated AFM cantilever gripper for nanomechanical characterization of compliant materials
DOI: 10.1088/1361-6528/ab88ed - Authors: Z Li, S Gao, U Brand, K Hiller and H Wolff
- Publication: Nanotechnology
- Publisher: IOP Publishing
- Date: 11 May 2020
MikroMasch® shared a video - how to fabricate a photo on a silicon wafer using nanotechnologySat Oct 09 2021
Check out this cool educational video from MIT.nano demonstrating how to fabricate a photo on a silicon wafer using nanotechnology.
Happy American Nanotechnology day!
BudgetSensors® celebrates Niels Bohr birthdayThu Oct 07 2021
"How wonderful that we have met with a paradox. Now we have some hope of making progress.” Today we celebrate the birthday of the late Niels Bohr, a Danish physicist famous for, among other things, developing the Bohr model of the atom.
BOSCH and KIT Researchers Explore Tip Wear and Tip Shape Impact on Measurement Uncertainty During Thermal Grooving AFM StudyTue Sep 14 2021
Discover how nanotools SuperSharpStandard-NCHR with 2-3 nm radius was applied to accurately measure nickel grain boundary grooves of solid oxide fuel cell (SOFC) anodes.
- Title: A thermal grooving study of relative grain boundary energies of nickel in polycrystalline Ni and in a Ni/YSZ anode measured by atomic force microscopy
- Authors: Patricia Haremski, Lars Epple, Matthias Wieler, Piero Lupetin, Richard Thelen, Michael J. Hoffmann
- Publication: Acta Materialia
- Publisher: Elsevier
- Date: 1 August 2021
#AFM #metrology #topography #microscopy #nanotechnology #BOSCH #KIT
BudgetSensors® diamond-like carbon coated Tap300DLC AFM tips used in a recent studyThu Sep 09 2021
High precision mechanical nanopatterning of graphene with our diamond-like carbon coated Tap300DLC AFM tips for the fabrication of graphene quantum point contact devices.
MikroMasch® thanks Ernest Rutherford for his experiment.Mon Aug 30 2021
On this day in 1871 Ernest Rutherford, the father of nuclear physics, was born. Thanks to the Rutherford gold foil experiment we know that atoms have very small nuclei, where most of their mass is concentrated, surrounded by orbiting electrons.
Do we measure the atomic nuclei with atomic resolution Atomic Force Microscopy?
Beetles Elytra, a model structure for next-generation bioinspired synthetic materialsFri Aug 13 2021
Discover how nanotools biotool hi-res, SSS-FMR with 2-3 nm radius and biosphere™ with 50 nm radius are applied for imaging and indentation measurements.
- Title: A matter of size? Material, structural and mechanical strategies for size adaptation in the elytra of Cetoniinae beetles
- Authors: Meisam Asgari, Nicolas A. Alderete, Zhaowen Lin, Ryan Benavides, Horacio D. Espinosa
- Publication: Acta Biomaterialia
- Publisher: Elsevier
- Date: 1 March 2021
HQ:XSC11/No Al used in a recent studyWed Jul 28 2021
Our HQ:XSC11/No Al AFM probes take part in the analysis of groove arrays created by femtosecond pulse laser for hydrodynamic particle focusing.
Happy birthday to Gerd Binnig!Tue Jul 20 2021
Quite often decades pass between an important discovery in natural sciences and its respective Nobel Prize. Not so with the discovery of the Scanning Tunneling Microscope in 1981, which earned its inventors half of the 1986 Nobel Prize. Happy birthday to Gerd Binnig, co-inventor of the Scanning Tunneling Microscope and the Atomic Force Microscope!
EBD-16: Semi Fab proven solution for extreme deep trench metrologyWed Jul 14 2021
Blue Line product highlight:
EBD-16™: World's longest high-performance AFM tip.
- Optimized conical shape for enhanced stability
Precisely controlled DLC spike length > 16 µm (Total tip length > 26 µm) - Controlled orientation: 12°, 13° or 3°
Tilt compensation for enhanced access to bottom trench features - Diamond-like hardness and durability
Unmatched wear resistance for consistent depth data, enhanced throughput, and reduced cost per measurement - Optimized cantilevers
Standard with k: 40 N/m, f: 320 kHz. Softer cantilevers available. - Delivered with TrueDimensions™
Datasheet for every single probe available online 24/7 via QR code
Images of collagen adsorbed to mica collected with HQ:NSC15/Al BS AFM probesTue Jun 29 2021
Our HQ:NSC15/Al BS AFM probes collect images of collagen adsorbed to mica in this study of environmentally controlled curvature of single collagen proteins.
NANOSENSORS Membrane Surface Stress Sensors (MSS) used by NECThu Jun 24 2021
NEC uses NANOSENSORS Membrane Surface Stress Sensors (MSS) in their development of a measuring device that enables spatial monitoring of SARS-CoV-2
To learn more about NANOSENSORS MSS please have a look at the MSS Webpage https://www.mss-sensor.com/ or the MSS Youtube video
Tap300Al-G AFM probes used in a recent study.Thu Jun 17 2021
Tap300Al-G AFM probes are used to analyze iron thin films coated optics for corrosion monitoring, a vital step in the prevention of methane leaks and catastrophic effects in natural gas pipelines
MikroMasch® celebrates Heinrich Rohrer's birthday!Thu Jun 10 2021
Celebrating the birthday of the late Heinrich Rohrer! The Swiss physicist shared half of the 1986 Nobel Prize in Physics with Gerd Binnig for the invention of the Scanning Tunneling Microscope (STM), the predecessor of the Atomic Force Microscope (AFM). Thank you for leading the way!
Flat Tip Effectively Avoids Tip-derived Youngs Modulus Errors Introduced by Conventional TipsMon May 31 2021
Discover how nanotools Flat Tip with precisely controlled indentation area is applied to effectively measure Young's modulus of a whole yeast cell.
- Title: Evaluating Young's Modulus of Single Yeast Cells Based on Compression Using an Atomic Force Microscope with a Flat Tip
- Authors: Di Chang, Takahiro Hirate, Chihiro Uehara, Hisataka Maruyama, Nobuyuki Uozumi, Fumihito Arai
- Publication: Microscopy and Microanalysis
- Publisher: Cambridge University Press
- Date: Jan 15, 2021
Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopyTue May 25 2021
Organic-inorganic halide perovskites are materials of high interest for the development of solar cells. Learning more about the relationship between the electrical properties and the chemical compositions of perovskite at the nanoscale can help to understand how the interrelations of both can affect device performance and contribute to an understanding on how to best design … Continue reading
Temperature effects on the nano-friction across exposed atomic step edgesThu May 20 2021
In the article “Temperature effects on the nano-friction across exposed atomic step edges” Wen Wang, Ashu Wang and Lingyan Zeng describe how they used friction force microscopy ( FFM ) under ultrahigh vacuum ( UHV) conditions to study the temperature dependence of nanoscale friction between a silicon AFM tip ( NANOSENSORS™ PointProbe® Plus PPP-LFMR AFM […]
BudgetSensors® celebrates Christoph Gerber's birthday!Sat May 15 2021
Happy birthday to Christoph Gerber, co-inventor of the Atomic Force Microscope!
AFM probes for Magnetic Force Microscopy – screencast on NanoWorld® MFM tips passes 2000 views markFri May 14 2021
The screencast about NanoWorld AFM probes for Magnetic Force Microscopy held by Dr. Marco Becker has just passed the 2000 views mark. Congratulations Marco! Magnetic Force Microscopy is a type of Atomic Force Microscopy in which a magnetised AFM tip is used to measure magnetic interactions between the tip and the surface of a magnetic … Continue reading
nanotools biosphere™ probes featured in research articleTue May 11 2021
Discover how nanotools hydrophobic and chemical resistant biosphere™ with precisely controlled 20 and 50 nm radius and pre-calibrated cantilevers are applied to study the mechanical properties of supported lipid bilayers.
https://www.nanotools.com/blog/influence-of-afm-tip-radius-when-measuring-mechanical-properties-of-biomimetic-membranes.html
Highlights
AFM Probe Focus
qp-HBC
uniqprobe™ - HeartBeat Cantilever for ScanAsyst®** and Peak Force Tapping™**
Coating:
Reflective Aluminum
Tip Shape: Circular symmetric
Tip Shape: Circular symmetric
AFM Cantilever:
F
60 kHz
C
0.5 N/m
L
115 µm
ATEC-NC
Tapping Mode AFM Probe with REAL Tip Visibility
Coating:
none
Tip Shape: Visible
Tip Shape: Visible
AFM Cantilever:
F
335 kHz
C
45 N/m
L
160 µm
TESPA
Standard Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
OTESPA
Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating:
Reflective Aluminum
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilever:
F
300 kHz
C
26 N/m
L
160 µm
