AFM Probes  »  
 Request a quote (RFQ)
Order Code / Price*
AR10T-NCHR-10 Box of 10 AFM Probes
2378.00 USD
AR10T-NCHR-20 Box of 20 AFM Probes
4256.00 USD
Your volume discount is 500.00 USD or 10.50%
AR10T-NCHR-50 Box of 50 AFM Probes
9387.00 USD
Your volume discount is 2503.00 USD or 21.10%
AR10T-NCHR-W Box of 370 AFM Probes
47344.00 USD
Your volume discount is 40642.00 USD or 46.20%
Product availability: On stock


best of the best

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflective Aluminum
AFM tip shape: High-Aspect-Ratio
AFM Cantilever
F 330 kHz
C 42 N/m
L 125 µm
*nominal values
How to optimize AFM scan parameters gear icon

NANOSENSORS™ AR10T-NCHR AFM tips are designed for non-contact mode or tapping mode AFM. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored AFM tips. These AFM tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 10:1 at the end of the common silicon AFM tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the AFM tip.

On the model AR10T the last 1.5 µm of the AFM tip are tilted 13° to the center axis of the AFM cantilever. With this feature the tilt angle of the AFM cantilever caused by the mount of the AFM head (commonly 13°) will be compensated. Now, nearly vertical sidewalls can be measured offering a symmetrical scan.

The AFM probe offers unique features:
  • length of the high aspect ratio portion of the AFM tip > 1.5 µm
  • typical aspect ratio at 1.5 µm in the order of 12:1 (when viewed from side as well as along AFM cantilever axis)
  • high aspect ratio portion of the AFM tip tilted 13° to the AFM cantilever surface normal
  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • 125 µm (115 - 135 µm)*
  • 30 µm (22.5 - 37.5 µm)*
  • 4 µm ( 3 - 5 µm)*
  • * guaranteed range