Tilt Compensated Focused Ion Beam AFM Tips
AFM probes with tilt compensated focused ion beam (FIB) high aspect ratio spike active part of the AFM tips
4 results matching your criteria
best of the best


AR10T-NCHR
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: High-Aspect-Ratio
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm


AR5T-NCHR
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: High-Aspect-Ratio
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm
the industry standard


NW-AR5T-NCHR
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: High-Aspect-Ratio
Tip Shape: High-Aspect-Ratio
AFM Cantilever:
F
330 kHz
C
42 N/m
L
125 µm


NANOSENSORS™ Special Developments List (SDL)
Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise
Coating:
various
Tip Shape: various
Tip Shape: various