AFM Probes » AR5-NCLR

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Order Code / Price*
Quantity
AR5-NCLR-10 Box of 10 AFM Probes
889.00 USD
Volume Discount Available [?]
AR5-NCLR-20 Box of 20 AFM Probes
1 590.00 USD
Your volume discount is 188.00 USD or 10.60%
AR5-NCLR-50 Box of 50 AFM Probes
3 508.00 USD
Your volume discount is 937.00 USD or 21.10%
AR5-NCLR-W Box of 370 AFM Probes
17 304.00 USD
Your volume discount is 15 589.00 USD or 47.40%
Product availability: On stock

AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever

Coating: Reflex Aluminum
Tip shape: High-Aspect-Ratio
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

Applications

NANOSENSORS™ AR5-NCLR AFM tips are designed for non-contact or tapping mode AFM. The NCL probe is designed for SPM systems requiring a minimum cantilever length > 125 µm or a resonance frequency of less than 400 kHz. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This cantilever type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.

The probe offers unique features:

  • length of the high aspect ratio portion of the tip > 2 µm
  • typical aspect ratio at 2 µm in the order of 7:1 (when viewed from side as well as along cantilever axis)
  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.

Aluminium reflex coating on detector side of the cantilever

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 48 N/m (21 - 98 N/m)*
  • 190 kHz (146 - 236 kHz)*
  • 225 µm (215 - 235 µm)*
  • 38 µm (30 - 45 µm)*
  • 7 µm (6 - 8 µm)*
  • * typical range
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