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AR5T-NCHR-10 Box of 10 AFM Probes
1441.00 USD
AR5T-NCHR-20 Box of 20 AFM Probes
2579.00 USD
Your volume discount is 303.00 USD or 10.50%
AR5T-NCHR-50 Box of 50 AFM Probes
5689.00 USD
Your volume discount is 1516.00 USD or 21.00%
AR5T-NCHR-W Box of 370 AFM Probes
27687.00 USD
Your volume discount is 25630.00 USD or 48.10%
Product availability: On stock


High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflex Aluminum
AFM tip shape: High-Aspect-Ratio
AFM Cantilever
F 330 kHz
C 42 N/m
L 125 µm
*nominal values


How to optimize AFM scan parameters gear icon

NANOSENSORS™ AR5T-NCHR AFM tips are designed for non-contact mode or Tapping Mode AFM (also known as: attractive or dynamic mode). This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored AFM tips. These AFM tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion at the end of the common silicon AFM tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the AFM tip.

On the model AR5T the last 2 µm of the AFM tip are tilted 13° to the center axis of the AFM cantilever. With this feature the tilt angle of the AFM cantilever caused by the mount of the AFM head (commonly 13°) will be compensated. Now, nearly vertical sidewalls can be measured offering a symmetrical scan.

The AFM probe offers unique features:
  • length of the high aspect ratio portion of the AFM tip > 2 µm
  • typical aspect ratio at 2 µm in the order of 7:1 (when viewed from side as well as along AFM cantilever axis)
  • high aspect ratio portion of the AFM tip tilted 13° to the center axis of the AFM cantilever
  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

The reflex coating is a 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the AFM cantilever less than 2% of the AFM cantilever length.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • 125 µm (115 - 135 µm)*
  • 30 µm (22.5 - 37.5 µm)*
  • 4 µm ( 3 - 5 µm)*
  • * guaranteed range