CP-FM-SiO

This colloidal probe combines the well-known features of the proven NANOSENSORS™ FM AFM probes series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp AFM tip.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode.

The so called "Colloidal Probe Technique", where single colloids are attached with polymer glue to AFM cantilevers for force measurements, offers possibilities for a better understanding of fundamental interactions in a variety of fields. Examples are adhesion phenomena, particle-surface interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications.

The AFM probe offers unique features:

• sphere material: silicon dioxide (SiO2)
• excellent sphere diameter: A = 2 µm, B = 3.5 µm, C = 6.62 µm, D = 10.2 µm, or E = 15 µm (all +/- 5%)
  (Due to different masses the resonance frequency can differ.)
  Please choose A, B, C, D, or E when ordering!
• highly doped silicon AFM cantilever to dissipate static charge, chemically inert to most common solvents
• high mechanical Q-factor for high sensitivity
• precise alignment of the AFM cantilever position when used together with the Alignment chip (within +/- 2 µm)
• compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.