Micromachined monolithic silicon AFM probe for contact mode and lateral force microscopy (LFM) operation.
The consistent AFM tip radius of less than 10 nm ensures good resolution and reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.
With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.
Consistent high quality at a lower price!
This AFM probe features alignment grooves on the back side of the holder chip.