AFM Probes  »  

Contact-G

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Order Code / Price*
Quantity
Contact-G-10 Box of 10 AFM Probes
200.00 USD
Contact-G-380 Box of 380 AFM Probes
4500.00 USD
Your volume discount is 3100.00 USD or 40.80%
Product availability: On stock

Contact-G

Standard Contact Mode AFM Probe

Manufacturer: BudgetSensors

Coating: none
AFM tip shape: Rotated
AFM Cantilever
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

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Micromachined monolithic silicon AFM probe for contact mode and lateral force microscopy (LFM) operation.

The consistent AFM tip radius of less than 10 nm ensures good resolution and reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.

For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.

Consistent high quality at a lower price!

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.07 - 0.4 N/m)*
  • 13 kHz (9 - 17 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm ( 1 - 3 µm)*
  • * typical range
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