NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping™ mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.
For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.
These AFM probes offer unique features:
- length of the high aspect ratio portion of the tip > 1.5 µm
- typical aspect ratio of this portion in the order of 12:1 (when viewed from side as well as along cantilever axis)
- half cone angle of the high aspect ratio portion typically < 2.8°
- excellent tip radius of curvature