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PPP-NCLAuD

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PPP-NCLAuD-10 Box of 10 AFM Probes
381.00 USD
Product availability: On stock

PPP-NCLAuD

Gold Coated Tapping Mode AFM Probe with Long AFM Cantilever

Manufacturer: NANOSENSORS

Coating: Reflective Gold
AFM tip shape: Standard
AFM Cantilever
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

Applications

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The Point Probe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCLAuD AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLAuD is recommended if the feedback loop of the microscope does not accept high frequencies (400kHz) or if the detection system needs a minimum AFM cantilever length >125µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Au coating on detector side of AFM cantilever
  • chemically inert

This AFM probe features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 48 N/m (21 - 98 N/m)*
  • 190 kHz (146 - 236 kHz)*
  • 225 µm (215 - 235 µm)*
  • 38 µm (30 - 45 µm)*
  • 7 µm ( 6 - 8 µm)*
  • * guaranteed range
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