AFM Probes » PPP-NCLR

 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
PPP-NCLR-10 Box of 10 AFM Probes
320.00 USD
PPP-NCLR-50 Box of 50 AFM Probes
1 265.00 USD
Your volume discount is 335.00 USD or 20.90%
PPP-NCLR-W Box of 380 AFM Probes
6 409.00 USD
Your volume discount is 5 751.00 USD or 47.30%
Product availability: On stock

PPP-NCLR

Tapping Mode AFM Probe, Long Cantilever

Coating: Reflex Aluminum
Tip shape: Standard
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

Applications

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLR is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
 
The probe offers unique features:

  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 48 N/m (21 - 98 N/m)*
  • 190 kHz (146 - 236 kHz)*
  • 7 µm (6 - 8 µm)*
  • * typical range
    Loading
    nanosensors-logo nanoworld-logo budgetsensors-logo mikromasch-logo opus-logo nanotools-logo