PPP-QNCHR

The PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminum coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.

NANOSENSORS™ PPP-QNCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode) under UHV-conditions. Due to its high Q-factor and the typical features of the PPP series this AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

The AFM probe offers unique features:

• excellent AFM tip radius of curvature
• highly doped silicon to dissipate static charge
• Al coating on detector side of AFM cantilever
• chemically inert
• excellent mechanical Q-factor under UHV conditions for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.