PPP-RT-FMR

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The FM AFM probe serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM AFM tip but with reduced operation stability.

For certain applications the rotated PointProbe® Plus AFM tip offers more symmetric imaging. The rotated AFM tip shape is identical to the classic AFM tip shape but it is rotated by 180° degrees with respect to the AFM cantilever beam direction.

The AFM probe offers unique features:

• excellent AFM tip radius of curvature
• highly doped silicon to dissipate static charge
• high mechanical Q-factor for high sensitivity
• precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.