The XY-auto-alignment probes for Contact mode application with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 450µm long AFM cantilevers optimized for contact mode applications. AFM probe exchange with an AFM tip repositioning accuracy of better than ±8µm is possible for all AFM probes of the XY-alignment AFM probes series – independent of their AFM cantilever length. This series is adjusted to the AFM tip position of AFM probes with an AFM cantilever length of 225µm.
As a matter of course, the features of the proven PointProbe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible AFM tip radius as well as a precisely defined AFM tip shape are maintained. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The AFM probe offers unique features:
This AFM probe features alignment grooves on the back side of the holder chip.