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PPP-XYCONTR

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Order Code / Price*
Quantity
PPP-XYCONTR-10 Box of 10 AFM Probes
381.00 USD
PPP-XYCONTR-20 Box of 20 AFM Probes
681.00 USD
Your volume discount is 81.00 USD or 10.60%
PPP-XYCONTR-50 Box of 50 AFM Probes
1503.00 USD
Your volume discount is 402.00 USD or 21.10%
Product availability: On stock

PPP-XYCONTR

Contact Mode AFM Probe with Special Alignment System

Manufacturer: NANOSENSORS

Coating: Reflective Aluminum
AFM tip shape: Standard
AFM Cantilever
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

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The XY-auto-alignment probes for Contact mode application with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 450µm long AFM cantilevers optimized for contact mode applications. AFM probe exchange with an AFM tip repositioning accuracy of better than ±8µm is possible for all AFM probes of the XY-alignment AFM probes series – independent of their AFM cantilever length. This series is adjusted to the AFM tip position of AFM probes with an AFM cantilever length of 225µm.

As a matter of course, the features of the proven PointProbe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible AFM tip radius as well as a precisely defined AFM tip shape are maintained. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of AFM cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • AFM tip repositioning accuracy of better than ±8µm (in combination with Alignment Chip)

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.02 - 0.77 N/m)*
  • 13 kHz (6 - 21 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (42.5 - 57.5 µm)*
  • 2 µm ( 1 - 3 µm)*
  • * guaranteed range
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