PPP-XYCONTR AFM Probe

Contact Mode AFM Probe with Special Alignment System

Coating: Reflex Aluminum
Tip shape: Standard

Cantilever:

F 13 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

The XY-auto-alignment probes for Contact mode application with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 450 µm long cantilevers optimized for contact mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8µm is possible for all probes of the XY-alignment probes series – independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225µm.

As a matter of course, the features of the proven PointProbe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The probe offers unique features:

excellent tip radius of curvature
highly doped silicon to dissipate static charge
Al coating on detector side of cantilever
chemically inert
high mechanical Q-factor for high sensitivity
tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)

This product features alignment grooves on the back side of the holder chip.