AFM Probes » Q-CONT

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Q-CONT-15 Box of 15 AFM Probes
405.00 USD
Product availability: Available on demand. Please contact us for availability!

Q-CONT

Premounted Standard Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Manufacturer: BudgetSensors

Coating: Reflex Aluminum
AFM tip shape: Rotated
AFM Cantilever
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

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Micromachined monolithic silicon AFM probe for contact mode and lateral force microscopy (LFM) operation.

The consistent AFM tip radius of less than 10 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.

The AFM probe features a reflective aluminum coating on the back side of the AFM cantilever.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on BudgetSensors ContAl-G AFM probe.

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.07 - 0.4 N/m)*
  • 13 kHz (9 - 17 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm ( 1 - 3 µm)*
  • * typical range
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