AFM Probes » Q-CONT

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Q-CONT-15 Box of 15 AFM Probes
405.00 USD
Product availability: Available on demand. Please contact us for availability!
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Q-CONT

Premounted Standard Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflex Aluminum
Tip shape: Rotated
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

Monolithic silicon AFM probe for contact mode and lateral force mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ContAl-G AFM probe.

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.07 - 0.4 N/m)*
  • 13 kHz (9 - 17 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm (1 - 3 µm)*
  • * typical range
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