Micromachined monolithic silicon AFM probe for contact mode and lateral force microscopy (LFM) operation.
The consistent AFM tip radius of less than 10 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.
The AFM probe features a reflective aluminum coating on the back side of the AFM cantilever.
Consistent high quality at a lower price!
Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on BudgetSensors ContAl-G AFM probe.