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ContAl-G

Order Code / Price*

Quantity

ContAl-G-10 Box of 10 AFM Probes

210 210.00 USD

Volume Discount Available [?]

ContAl-G-50 Box of 50 AFM Probes

890 890.00 USD

Your volume discount is 160.00 USD or 15.20%

ContAl-G-380 Box of 380 AFM Probes

4500 4500.00 USD

Your volume discount is 3480.00 USD or 43.60%

Product availability: On stock

ContAl-G Box of: max. 50 AFM Probes

Buy these AFM Probes together with other BudgetSensors AFM probes of your choice in a Budget Combo Box!

Side view SEM image of SiNi wedge (double) AFM tip of AFM cantilever l

Side view SEM image of uncoated silicon AFM tip l

Front view SEM image of uncoated AFM tip

ContAl-G

Name: ContAl-G-10 Standard Contact Mode AFM Probe
Brand: BudgetSensors
SKU: ContAl-G-10
Price: 210 USD
Availability: InStock

best bang for your buck

Standard Contact Mode AFM Probe

Manufacturer: BudgetSensors

Coating: Reflective Aluminum
AFM tip shape: Rotated

AFM Cantilever

F 13 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

Contact Mode AFM Probes

How to optimize AFM scan parameters

Micromachined monolithic silicon AFM probe for contact mode and lateral force microscopy (LFM) operation.

The consistent AFM tip radius of less than 10 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.

The AFM probe features a reflective aluminum coating on the back side of the AFM cantilever. For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.

Consistent high quality at a lower price!

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

AFM Tip:

Shape: Rotated

Height: 17 µm (15 - 19 µm)*

Setback: 15 µm (10 - 20 µm)*

Radius: < 10 nm

Half Cone Angle: 20°-25° along cantilever axis25°-30° from side10° at the apex

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.07 - 0.4 N/m)*

Resonance Frequency: 13 kHz (9 - 17 kHz)*

Length: 450 µm (440 - 460 µm)*

Width: 50 µm (45 - 55 µm)*

Thickness: 2 µm ( 1 - 3 µm)*

* typical range

Steps on strontium titanate

Topography and 3D topography images of SrTiO3 single crystal substrate

Scanned with a BudgetSensors ContAl-G AFM probe in contact mode, 5 micron scan size

Image courtesy of Prof. Yunseok Kim Sungkyunkwan University, South Korea

Strontium Titanate

Topography and 3D topography images of polycrystalline SrTiO3 single crystal substrate

Scanned with a BudgetSensors ContAl-G AFM probe in contact mode, 5 micron scan size

Image courtesy of Prof. Yunseok Kim, Sungkyunkwan University, South Korea

Human hair

Contact mode topography image rendered in 3D and overlaid with the Lateral Force Microscopy image showing nicely the scales’ morphology as well as some hairspray droplets.

Scanned with a BudgetSensors ContAl-G AFM probe, 40 micron scan size

Image courtesy of Dr. Yordan Stefanov, Innovative Solutions Bulgaria

Human platelet on glass coverslip

Topography image of human platelet acquired at room temperature

Scanned with a BudgetSensors ContAl-G AFM probe, 6 micron scan size

Image courtesy of Dr. Tonya Andreeva, Institute of Biophysics and Biomedical Engineering, BAS