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ContAl-G

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Order Code / Price*
Quantity
ContAl-G-10 Box of 10 AFM Probes
210.00 USD
ContAl-G-380 Box of 380 AFM Probes
4500.00 USD
Your volume discount is 3480.00 USD or 43.60%
Product availability: On stock

ContAl-G

best bang for your buck

Standard Contact Mode AFM Probe

Manufacturer: BudgetSensors

Coating: Reflective Aluminum
AFM tip shape: Rotated
AFM Cantilever
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

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Micromachined monolithic silicon AFM probe for contact mode and lateral force microscopy (LFM) operation.

The consistent AFM tip radius of less than 10 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.

The AFM probe features a reflective aluminum coating on the back side of the AFM cantilever. For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.

Consistent high quality at a lower price!

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.07 - 0.4 N/m)*
  • 13 kHz (9 - 17 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm ( 1 - 3 µm)*
  • * typical range
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