AFM Probes » Q-WM190-SSS

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Q-WM190-SSS-10 Box of 10 AFM Probes
850.00 USD
Product availability: Available on demand. Please contact us for availability!

Q-WM190-SSS

Premounted, SuperSharp Tapping Mode AFM Probe with Long AFM Cantilever, for Quesant/Ambios AFM systems

Manufacturer: NANOSENSORS

Coating: Reflex Aluminum
AFM tip shape: Supersharp
AFM Cantilever
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

Applications

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NANOSENSORS™ SSS-NCLR AFM probes are designed for non-contact mode or tapping mode AFM. They are offered as an alternative to the NANOSENSORS™ high frequency non contact type (NCH). The SSS-NCLR is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum AFM cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • typical aspect ratio at 200 nm from AFM tip apex in the order of 4:1
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a NANOSENSORS SSS-NCLR AFM probe.

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the AFM cantilever less than 2% of the AFM cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 48 N/m (21 - 98 N/m)*
  • 190 kHz (146 - 236 kHz)*
  • 225 µm (215 - 235 µm)*
  • 38 µm (30 - 45 µm)*
  • 7 µm ( 6 - 8 µm)*
  • * typical range
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