NANOSENSORS™ SSS-FMR AFM probes are designed for force modulation mode.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FMR AFM tip serves also as a basis for high resolution AFM tips with magnetic coating SSS-MFMR. Furthermore non-contact or tapping mode operation is possible with the FM AFM tip but with reduced operation stability.
The AFM probe offers unique features:
This AFM probe features alignment grooves on the back side of the holder chip.