AFM Probes » SSS-FMR

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Order Code / Price*
Quantity
SSS-FMR-10 Box of 10 AFM Probes
757.00 USD
SSS-FMR-50 Box of 50 AFM Probes
2988.00 USD
Your volume discount is 797.00 USD or 21.10%
Product availability: On stock

SSS-FMR

SuperSharp, Force Modulation AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflex Aluminum
AFM tip shape: Supersharp
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

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NANOSENSORS™ SSS-FMR AFM probes are designed for force modulation mode.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FMR AFM tip serves also as a basis for high resolution AFM tips with magnetic coating SSS-MFMR. Furthermore non-contact or tapping mode operation is possible with the FM AFM tip but with reduced operation stability.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • typical aspect ratio at 200 nm from AFM tip apex in the order of 4:1
  • monolithic material
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the AFM cantilever less than 3.5% of the AFM cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (0.5 - 9.5 N/m)*
  • 75 kHz (45 - 115 kHz)*
  • 225 µm (215 - 235 µm)*
  • 30 µm (20 - 35 µm)*
  • 3 µm ( 2 - 4 µm)*
  • * typical range
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