AFM Probes » SSS-FMR

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Order Code / Price*
Quantity
SSS-FMR-10 Box of 10 AFM Probes
757.00 USD
SSS-FMR-50 Box of 50 AFM Probes
2 988.00 USD
Your volume discount is 797.00 USD or 21.10%
Product availability: On stock

SSS-FMR

SuperSharp, Force Modulation AFM Probe

Coating: Reflex Aluminum
Tip shape: Supersharp
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

NANOSENSORS SSS-FMR AFM probes are designed for force modulation mode.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FMR tip serves also as a basis for high resolution tips with magnetic coating SSS-MFMR. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

  • excellent tip radius of curvature
  • typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • monolithic material
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (0.5 - 9.5 N/m)*
  • 75 kHz (45 - 115 kHz)*
  • 225 µm (215 - 235 µm)*
  • 30 µm (20 - 35 µm)*
  • 3 µm (2 - 4 µm)*
  • * typical range
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