AFM non-contact mode topography image of LaAlO3 thin film on SrTiO3 single crystal. One step corresponds to 1 unit cell of SrTiO3 with a height of 0.3905nm.
Scanned with a MikroMasch HQ:NSC35/Al BS
AFM probe, short cantilever on an NT-MDT Ntegra Prima system; 3x1.3 micron scan size
Image courtesy of Dr. Martin Lilienblum, PhD Student at the Department of Materials, ETH Zurich, Switzerland