AFM Probes » qp-BioAC

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Order Code / Price*
Quantity
qp-BioAC-10 Box of 10 AFM Probes
395.00 USD
qp-BioAC-50 Box of 50 AFM Probes
1 545.00 USD
Your volume discount is 430.00 USD or 21.80%
Product availability: On stock

qp-BioAC

uniqprobe™ - uniform quality SPM probe for non-contact/tapping mode/contact mode with 3 different cantilevers

Coating: Reflex (Au)
Tip shape: Circular symmetric
This probe features 3 cantilevers
F 90 kHz
C 0.3 N/m
L 40 µm
F 50 kHz
C 0.1 N/m
L 60 µm
F 30 kHz
C 0.06 N/m
L 80 µm
*nominal values

Applications

The NANOSENSORS uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.

The unsurpassed uniformity of the mechanical characteristics of the uniqprobe series is particularly important for applications, where a large number of probes with known and near identical force constants or resonance frequencies are needed. The sensors of the uniqprobe series are especially adapted for molecular biology, biophysics and quantitative nano-mechanical studies.

NANOSENORS qp-BioAC AFM probes are designed for mainly dynamic mode AFM imaging in air or liquid environments, but can also be used in contact mode. These probes feature three different rectangular cantilevers on one side of the support chip. The uniqprobe BioAC type unites fairly high resonance frequencies with low force constants. The combination of these characteristics leads to stable, low noise and fast measurements with reduced tip-sample interaction.

The probe offers unique features:

  • small dispersion of force constant and resonance frequency 
  • typical tip height 7µm 
  • typical tip radius of curvature smaller than 10nm
  • stress free cantilevers with considerably less bending
  • tip and cantilevers are made of a quartz-like material
  • reduced drift for applications in liquid environments
  • tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
  • chemically inert

This product features alignment grooves on the back side of the holder chip.

A chromium/gold layer of about 60nm is partially coating the cantilever on the detector side near its free end where the tip is situated. The main advantages of this partial metallic coating are considerably less cantilever bending and reduced drift for SPM measurements in liquid environments.

AFM Tip:


  • 3 AFM Cantilevers:

    Cantilever 1
  • Beam
  • 0.3 N/m (0.15 - 0.55 N/m)*
  • 90 kHz (65 - 115 kHz)*
  • 400 nm (370 - 430 nm)*
  • Cantilever 2
  • Beam
  • 0.1 N/m (0.06 - 0.18 N/m)*
  • 50 kHz (35 - 65 kHz)*
  • 400 nm (370 - 430 nm)*
  • Cantilever 3
  • Beam
  • 0.06 N/m (0.03 - 0.09 N/m)*
  • 30 kHz (24 - 36 kHz)*
  • 400 nm (370 - 430 nm)*
  • * typical range
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