AFM Probes » qp-fast

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Order Code / Price*
Quantity
qp-fast-10 Box of 10 AFM Probes
395.00 USD
qp-fast-50 Box of 50 AFM Probes
1 545.00 USD
Your volume discount is 430.00 USD or 21.80%
Product availability: On stock

qp-fast

uniqprobe™ for Soft/Standard/Fast Tapping/Dynamic AFM imaging

Coating: Reflex (Au)
Tip shape: Circular symmetric
This probe features 3 cantilevers
F 800 kHz
C 80 N/m
L 40 µm
F 420 kHz
C 30 N/m
L 60 µm
F 250 kHz
C 15 N/m
L 80 µm
*nominal values

Applications

NANOSENSORS qp-fast AFM probes with its 3 cantilevers are designed for soft-, standard- and fast- Non-Contact or Tapping Mode AFM imaging (also known as attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability in air and liquid environments.

A metallic layer (Au) is coated on the detector side of the cantilever. The cantilever bending is less than 2⁰.

The NANOSENSORS uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.

The unsurpassed uniformity of the mechanical characteristics of the uniqprobe series is particularly important for applications, where a large number of probes with known and near identical force constants or resonance frequencies are needed.

The probe offers unique features:

  • 3 cantilevers design for soft-, standard- and fast- Tapping/Dynamic Mode operation
  • small dispersion of force constant and resonance frequency
  • circular symmetric tip shape with a hyperbolic profile
  • typical tip height 6µm 
  • typical tip radius of curvature smaller than 10nm
  • Au coating on detector side of cantilever
  • tip and cantilevers are made of a quartz-like material
  • alignment grooves on backside of silicon holder chip
  • tip repositioning accuracy of better than ± 8µm (in combination with Alignment Chip)
  • chemically inert

This product features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.

AFM Tip:


  • 3 AFM Cantilevers:

  • Beam
  • 80 N/m (50 - 140 N/m)*
  • 800 kHz (600 - 1000 kHz)*
  • 40 µm (35 - 45 µm)*
  • 22 µm (20 - 24 µm)*
  • 2.500 µm (2.470 - 2.530 µm)*
  • Beam
  • 30 N/m (20 - 45 N/m)*
  • 420 kHz (340 - 500 kHz)*
  • 60 µm (55 - 65 µm)*
  • 27 µm (25 - 29 µm)*
  • 2.500 µm (2.470 - 2.530 µm)*
  • Beam
  • 15 N/m (10 - 20 N/m)*
  • 250 kHz (200 - 300 kHz)*
  • 80 µm (75 - 85 µm)*
  • 32 µm (30 - 34 µm)*
  • 2.500 µm (2.470 - 2.530 µm)*
  • * typical range
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