AFM Probes » qp-fast

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Order Code / Price*
Quantity
qp-fast-10 Box of 10 AFM Probes
395.00 USD
qp-fast-50 Box of 50 AFM Probes
1545.00 USD
Your volume discount is 430.00 USD or 21.80%
Product availability: On stock

qp-fast

best of the best

uniqprobe™ for Soft/Standard/Fast Tapping/Dynamic AFM imaging

Manufacturer: NANOSENSORS

Coating: Reflex Gold
AFM tip shape: Circular symmetric
This probe features 3 cantilevers
F 800 kHz
C 80 N/m
L 40 µm
F 420 kHz
C 30 N/m
L 60 µm
F 250 kHz
C 15 N/m
L 80 µm
*nominal values

Applications

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NANOSENSORS™ qp-fast AFM probes with its 3 AFM cantilevers are designed for soft-, standard- and fast- Non-Contact or Tapping Mode AFM imaging (also known as attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability in air and liquid environments.

A metallic layer (Au) is coated on the detector side of the AFM cantilever. The AFM cantilever bending is less than 2⁰.

The NANOSENSORS™ uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.

The unsurpassed uniformity of the mechanical characteristics of the uniqprobe series is particularly important for applications, where a large number of AFM probes with known and near identical force constants or resonance frequencies are needed.

The AFM probe offers unique features:

  • 3 AFM cantilevers design for soft-, standard- and fast- Tapping/Dynamic Mode operation
  • small dispersion of force constant and resonance frequency
  • circular symmetric AFM tip shape with a hyperbolic profile
  • typical AFM tip height 6µm
  • typical AFM tip radius of curvature smaller than 10nm
  • Au coating on detector side of AFM cantilever
  • AFM tip and AFM cantilevers are made of a quartz-like material
  • alignment grooves on backside of silicon holder chip
  • AFM tip repositioning accuracy of better than ± 8µm (in combination with Alignment Chip)
  • chemically inert

This product features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the AFM cantilever less than 2 % of the AFM cantilever length.

AFM Tip:


  • 3 AFM Cantilevers:

  • Beam
  • 80 N/m (50 - 140 N/m)*
  • 800 kHz (600 - 1000 kHz)*
  • 40 µm (35 - 45 µm)*
  • 22 µm (20 - 24 µm)*
  • 2500 nm ( 2470 - 2530 nm)*
  • Beam
  • 30 N/m (20 - 45 N/m)*
  • 420 kHz (340 - 500 kHz)*
  • 60 µm (55 - 65 µm)*
  • 27 µm (25 - 29 µm)*
  • 2500 nm ( 2470 - 2530 nm)*
  • Beam
  • 15 N/m (10 - 20 N/m)*
  • 250 kHz (200 - 300 kHz)*
  • 80 µm (75 - 85 µm)*
  • 32 µm (30 - 34 µm)*
  • 2500 nm ( 2470 - 2530 nm)*
  • * typical range
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