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160AC-FG-5 Box of 5 AFM Probes
1100.00 USD
Product availability: On stock
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High Aspect Ratio, Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Reflective Gold
AFM tip shape: High-Aspect-Ratio
AFM Cantilever
F 300 kHz
C 26 N/m
L 160 µm
*nominal values
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The 160AC-FG AFM probe with a carbon nanofiber at the end of the silicon AFM tip is designed for tapping or non-contact mode AFM imaging of deep trenches. The typical fiber radius of curvature is 10 nm and the diameter is 50 nm at a height of 200 nm away from the apex.

The gold coating ensures high and stable laser reflectivity in air and liquids.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

Please note that while the tetrahedral AFM tip and the AFM tip side of the AFM cantilever are gold coated, the diamond-like spike remains uncoated.

This AFM probe features alignment grooves on the back side of the holder chip.

70 nm Au on both sides of the cantilever. The coating does not cover the high aspect ratio spike!
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 26 N/m (8 - 57 N/m)*
  • 300 kHz (200 - 400 kHz)*
  • 160 µm (150 - 170 µm)*
  • 40 µm (38 - 42 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range