High Resolution, Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever
The 160AC-SG AFM probe with a sharp diamond-like spike is designed for high resolution tapping or non-contact mode AFM imaging.
The gold coating ensures high and stable laser reflectivity in air and liquids.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
Please note that while the tetrahedral AFM tip and the AFM tip side of the AFM cantilever are gold coated, the diamond-like spike remains uncoated.
This AFM probe features alignment grooves on the back side of the holder chip.