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Order Code / Price*
240AC-MA-10 Box of 10 AFM Probes
480.00 USD
240AC-MA-50 Box of 50 AFM Probes
1850.00 USD
Your volume discount is 550.00 USD or 22.90%
240AC-MA-100 Box of 100 AFM Probes
3400.00 USD
Your volume discount is 1400.00 USD or 29.20%
Product availability: On stock
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Hard Magnetic, Medium Momentum AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Magnetic
AFM tip shape: Optimized Positioning
AFM Cantilever
F 70 kHz
C 2 N/m
L 240 µm
*nominal values
How to optimize AFM scan parameters gear icon

The 240AC-MA AFM probe is designed for Magnetic Force Microscopy (MFM) measurements.

The hard magnetic AFM tip side coating ensures high magnetic force sensitivity and resolution. The back side aluminum coating significantly enhances the cantilever reflectivity in air or UHV.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

This AFM probe features alignment grooves on the back side of the holder chip.

Co alloy on the tip side of the cantilever, 30 nm Al on the back side of the cantilever
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm ( 2.1 - 3.1 µm)*
  • * typical range