The 240AC-MA AFM probe is designed for Magnetic Force Microscopy (MFM) measurements.
The hard magnetic AFM tip side coating ensures high magnetic force sensitivity and resolution. The back side aluminum coating significantly enhances the cantilever reflectivity in air or UHV.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
This AFM probe features alignment grooves on the back side of the holder chip.