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240AC-NN

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Order Code / Price*
Quantity
240AC-NN-10 Box of 10 AFM Probes
295.00 USD
240AC-NN-50 Box of 50 AFM Probes
1100.00 USD
Your volume discount is 375.00 USD or 25.40%
240AC-NN-100 Box of 100 AFM Probes
1880.00 USD
Your volume discount is 1070.00 USD or 36.30%
Product availability: On stock
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240AC-NN

Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: none
AFM tip shape: Optimized Positioning
AFM Cantilever
F 70 kHz
C 2 N/m
L 240 µm
*nominal values

Applications

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The 240AC series of AFM probes is designed for tapping mode AFM imaging of soft samples.

The uncoated AFM probe offers a sharp AFM tip apex, chemical inertness and a high AFM cantilever quality factor.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm ( 2.1 - 3.1 µm)*
  • * typical range
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