AFM Probes »

240AC-NN

Order Code / Price*

Quantity

240AC-NN-10 Box of 10 AFM Probes

251 295.00 USD 251.00 USD

Volume Discount Available [?]

240AC-NN-24 Box of 24 AFM Probes

502 590.00 USD 502.00 USD

Your volume discount is 100.40 USD or 16.70%

240AC-NN-50 Box of 50 AFM Probes

935 1100.00 USD 935.00 USD

Your volume discount is 320.00 USD or 25.50%

240AC-NN-100 Box of 100 AFM Probes

1598 1880.00 USD 1598.00 USD

Your volume discount is 912.00 USD or 36.30%

Product availability: On stock

Side view SEM image of Opus uncoated AFM tip

Side View SEM image of Opus uncoated AFM tip

SEM image of OPUS 240AC AFM probe

SEM image of Opus 240AC AFM probe

240AC-NN

Name: 240AC-NN-10 Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Brand: OPUS by MikroMasch
SKU: 240AC-NN-10
Price: 251 USD
Availability: InStock

Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: none
AFM tip shape: Optimized Positioning

AFM Cantilever

F 70 kHz

C 2 N/m

L 240 µm

*nominal values

Applications

How to optimize AFM scan parameters

The 240AC series of AFM probes is designed for tapping mode AFM imaging of soft samples.

The uncoated AFM probe offers a sharp AFM tip apex, chemical inertness and a high AFM cantilever quality factor.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:

Shape: Optimized Positioning

Height: 14 µm (12 - 16 µm)*

Setback: 0 µm

Radius: < 7 nm

Half Cone Angle: 0° front, 35° back, <9° side

AFM Cantilever:

Shape: Beam

Force Constant: 2 N/m (0.6 - 3.9 N/m)*

Resonance Frequency: 70 kHz (45 - 90 kHz)*

Length: 240 µm (230 - 250 µm)*

Width: 40 µm (38 - 42 µm)*

Thickness: 2.6 µm ( 2.1 - 3.1 µm)*

* typical range

Calibration grating

Topography image of the MikroMasch TGX calibration grating with undercut edges for lateral calibration and tip aspect ratio determination

Scanned with a OPUS by MikroMasch 240AC-NN AFM probe in light tapping mode, 12 micron scan size

Image courtesy of Dr. Penka Terziyska, Innovative Solutions Bulgaria