AFM Probes » 240AC-PP

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Order Code / Price*
Quantity
240AC-PP-10 Box of 10 AFM Probes
290.00 USD
240AC-PP-50 Box of 50 AFM Probes
1 190.00 USD
Your volume discount is 260.00 USD or 17.90%
240AC-PP-100 Box of 100 AFM Probes
1 990.00 USD
Your volume discount is 910.00 USD or 31.40%
Product availability: On stock
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240AC-PP

top value

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever

Coating: Electrically Conductive
Tip shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
*nominal values

Applications

The 240AC-PP is designed for AC mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc. The overall platinum coating ensures high electrical conductivity and significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

This product features alignment grooves on the back side of the holder chip.

25 nm Pt on both sides of the cantilever

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm (2.1 - 3.1 µm)*
  • * typical range
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