The 240AC-PP AFM probe is designed for AC mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc.
The overall platinum coating ensures high electrical conductivity and significantly enhances the AFM cantilever reflectivity in air or UHV.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
This AFM probe features alignment grooves on the back side of the holder chip.