AFM Probes » 240AC-PP

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Quantity
240AC-PP-10 Box of 10 AFM Probes
290.00 USD
240AC-PP-50 Box of 50 AFM Probes
1 190.00 USD
Your volume discount is 260.00 USD or 17.90%
240AC-PP-100 Box of 100 AFM Probes
1 990.00 USD
Your volume discount is 910.00 USD or 31.40%
Product availability: On stock
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240AC-PP

top value

Electrical, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Electrically Conductive
AFM tip shape: OPUS
AFM Cantilever
F 70 kHz
C 2 N/m
L 240 µm
*nominal values

Applications

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The 240AC-PP AFM probe is designed for AC mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc.

The overall platinum coating ensures high electrical conductivity and significantly enhances the AFM cantilever reflectivity in air or UHV.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

This product features alignment grooves on the back side of the holder chip.

25 nm Pt on both sides of the cantilever

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm ( 2.1 - 3.1 µm)*
  • * typical range
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