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240AC-SG-5 Box of 5 AFM Probes
995.00 USD
Product availability: On stock
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240AC-SG

New

High Resolution, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Reflective Gold
AFM tip shape: Supersharp,Optimized Positioning
AFM Cantilever
F 70 kHz
C 2 N/m
L 240 µm
*nominal values
Applications
How to optimize AFM scan parameters gear icon

The 240AC-SG AFM probe with a sharp diamond-like spike is designed for high resolution tapping AFM imaging on soft samples.

The gold coating ensures high and stable laser reflectivity in air and liquids.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

Please note that while the tetrahedral AFM tip and the AFM tip side of the AFM cantilever are gold coated, the diamond-like spike remains uncoated.

This AFM probe features alignment grooves on the back side of the holder chip.

70 nm Au on both sides of the cantilever. The coating does not cover the diamond-like spike!
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm ( 2.1 - 3.1 µm)*
  • * typical range
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