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55AC-NN-5 Box of 5 AFM Probes
290.00 USD
55AC-NN-24 Box of 24 AFM Probes
1100.00 USD
Your volume discount is 292.00 USD or 21.00%
55AC-NN-50 Box of 50 AFM Probes
2100.00 USD
Your volume discount is 800.00 USD or 27.60%
55AC-NN-100 Box of 100 AFM Probes
3995.00 USD
Your volume discount is 1805.00 USD or 31.10%
Product availability: On stock
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Ultra High Frequency AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: none
AFM tip shape: Optimized Positioning
AFM Cantilever
F 1200 kHz
C 85 N/m
L 65 µm
*nominal values
How to optimize AFM scan parameters gear icon

The 55AC series of AFM probes is designed for high speed scanning (HSS) AFM imaging.

The uncoated AFM probe offers a sharp AFM tip apex, chemical inertness and a high AFM cantilever quality factor.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

This AFM probe features alignment grooves on the back side of the holder chip.

AFM Tip:

  • AFM Cantilever:
  • Beam
  • 85 N/m (35 - 215 N/m)*
  • 1200 kHz (650 - 1850 kHz)*
  • 65 µm (55 - 75 µm)*
  • 31 µm (29 - 33 µm)*
  • 2.9 µm ( 2.4 - 3.4 µm)*
  • * typical range