Ultra High Frequency AFM Probe with AFM Tip at the Very End of the AFM Cantilever
The 55AC series of AFM probes is designed for high speed scanning (HSS) AFM imaging.
The uncoated AFM probe offers a sharp AFM tip apex, chemical inertness and a high AFM cantilever quality factor.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
This AFM probe features alignment grooves on the back side of the holder chip.