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NT_MCIS_v0010-5 Box of 5 AFM Probes
950.00 USD
Product availability: On stock

M-CIS

EBD AFM whisker for non-contact AFM microlens contact image sensor (CIS) inspection

Manufacturer: nanotools

Coating: Reflective Aluminum
AFM tip shape: High-Aspect-Ratio,Cone Shaped,EBD
AFM Cantilever
F 320 kHz
C 40 N/m
L 120 µm
*nominal values
Applications
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The SEMI standard for microlens contact image sensor (CIS) inspection: diamond-like EBD AFM whisker with an aspect ratio >5 for non-contact AFM.

This AFM probe features alignment grooves on the back side of the holder chip.

Al reflex
AFM Tip:
  • AFM Spike:

  • AFM Cantilever:
  • Beam
  • 40 N/m (20 - 60 N/m)*
  • 320 kHz (270 - 370 kHz)*
  • 120 µm (115 - 125 µm)*
  • 30 µm (28 - 32 µm)*
  • 4.4 µm ( 3.9 - 4.9 µm)*
  • * typical range
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