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NW-AR5-NCHR-10 Box of 10 AFM Probes
915.00 USD
NW-AR5-NCHR-20 Box of 20 AFM Probes
1637.00 USD
Your volume discount is 193.00 USD or 10.50%
NW-AR5-NCHR-50 Box of 50 AFM Probes
3612.00 USD
Your volume discount is 963.00 USD or 21.00%
NW-AR5-NCHR-W Box of 380 AFM Probes
18978.00 USD
Your volume discount is 15792.00 USD or 45.40%
Product availability: On stock

NW-AR5-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: Reflective Aluminum
AFM tip shape: High-Aspect-Ratio
AFM Cantilever
F 320 kHz
C 42 N/m
L 125 µm
*nominal values
Applications
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NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping™ mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored AFM tips showing a high aspect ratio portion with near-vertical sidewalls.

These AFM probes offer unique features:

  • length of the high aspect ratio portion of the tip > 2 µm
  • typical aspect ratio of this portion in the order of 7:1 (when viewed from side as well as along cantilever axis)
  • half cone angle of the high aspect ratio portion typically < 5°
  • excellent tip radius of curvature

For applications requiring lower resonance frequencies or a AFM cantilever length exceeding 125 µm use NanoWorld Pointprobe type AR5-NCLR.

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range
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