AFM Probes » NW-AR5-NCHR

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NW-AR5-NCHR-10 Box of 10 AFM Probes
839.00 USD
Volume Discount Available [?]
NW-AR5-NCHR-20 Box of 20 AFM Probes
1 502.00 USD
Your volume discount is 176.00 USD or 10.50%
NW-AR5-NCHR-50 Box of 50 AFM Probes
3 314.00 USD
Your volume discount is 881.00 USD or 21.00%
NW-AR5-NCHR-W Box of 380 AFM Probes
16 795.00 USD
Your volume discount is 15 087.00 USD or 47.30%
Product availability: From stock

NW-AR5-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflex Aluminum
Tip shape: High-Aspect-Ratio
Cantilever:
F 320 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.

These probes offer unique features:

  • length of the high aspect ratio portion of the tip > 2 µm
  • typical aspect ratio of this portion in the order of 7:1 (when viewed from side as well as along cantilever axis)
  • half cone angle of the high aspect ratio portion typically < 5°
  • excellent tip radius of curvature

For applications requiring lower resonance frequencies or a cantilever length exceeding 125 µm use NanoWorld Pointprobe type AR5-NCLR.

This product features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm (3.5 - 4.5 µm)*
  • * typical range
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