AFM Probes » NW-AR5-NCLR

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NW-AR5-NCLR-10 Box of 10 AFM Probes
839.00 USD
Volume Discount Available [?]
NW-AR5-NCLR-20 Box of 20 AFM Probes
1 502.00 USD
Your volume discount is 176.00 USD or 10.50%
NW-AR5-NCLR-50 Box of 50 AFM Probes
3 314.00 USD
Your volume discount is 881.00 USD or 21.00%
NW-AR5-NCLR-380 Box of 380 AFM Probes
16 795.00 USD
Your volume discount is 15 087.00 USD or 47.30%
Product availability: From stock

NW-AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever

Coating: Reflex Aluminum
Tip shape: High-Aspect-Ratio
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

Applications

NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.

These probes offer unique features:

  • length of the high aspect ratio portion of the tip > 2 µm
  • typical aspect ratio of this portion in the order of 7:1 (when viewed from side as well as along cantilever axis)
  • half cone angle of the high aspect ratio portion typically < 5°
  • excellent tip radius of curvature

This product features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 48 N/m (31 - 71 N/m)*
  • 190 kHz (160 - 210 kHz)*
  • 225 µm (220 - 230 µm)*
  • 38 µm (33 - 43 µm)*
  • 7 µm (6.5 - 7.5 µm)*
  • * typical range
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