NanoWorld Pointprobe® NCL AFM probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum AFM cantilever length (> 125 µm). This AFM probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.
For measurements on samples with sidewall angles approaching 90° we offer specially tailored AFM tips showing a high aspect ratio portion with near-vertical sidewalls.
These AFM probes offer unique features:
For applications allowing higher resonance frequencies or a shorter AFM cantilever length use NanoWorld Pointprobe type AR5-NCHR.
This AFM probe features alignment grooves on the back side of the holder chip.