AFM Probes » SiNi

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Quantity
SiNi-30 Box of 30 AFM Probes
379.00 USD
SiNi-300 Box of 300 AFM Probes
3 450.00 USD
Your volume discount is 340.00 USD or 9.00%
Product availability: On stock
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SiNi

Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip

Coating: Reflex (Au)
Tip shape: Pyramid
This probe features 4 cantilevers
F 30 kHz
C 0.27 N/m
L 100 µm
F 10 kHz
C 0.06 N/m
L 200 µm
*nominal values

Applications

This competitively priced silicon nitride AFM probe features:

  • 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip
  • silicon nitride wedge tip
  • overall tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
  • macroscopic half cone angle of 35°
  • 450 micron thick silicon holder chip

Consistent high quality at a lower price!

Gold/Chromium on detector side of the cantilever, 70 nm thick

AFM Tip:


  • 4 AFM Cantilevers:

    Short Cantilever
  • triangular
  • 0.27 N/m
  • 30 kHz
  • 100 µm (90 - 110 µm)*
  • 16 µm (11 - 21 µm)*
  • 520 nm (470 - 570 nm)*
  • Long Cantilever
  • triangular
  • 0.06 N/m
  • 10 kHz
  • 200 µm (190 - 210 µm)*
  • 30 µm (25 - 35 µm)*
  • 520 nm (470 - 570 nm)*
  • * typical range
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