Special micromachined silicon nitride AFM probe for soft contact imaging. This AFM probe features
- 2 silicon nitride AFM cantilevers for soft contact mode with two different lengths and force constants mounted on each side of the holder chip
- silicon nitride wedge AFM tips with radius less than 15 nm
- overall AFM tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
- macroscopic half cone angle of 35°
- 450 micron thick silicon holder chip
The holder chip with dimensions 3.4 x 1.6 x 0.45 mm fits most commercial AFM systems Consistent high quality at a lower price!
Consistent high quality at a lower price!